Oxford Instruments’ INCA system is the world’s leading platform for X-ray microanalysis on the Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM). Software and detector technology for Energy Dispersive Microanalysis (EDS), as well as Wavelength Dispersive Microanalysis (WDS) and Electron Backscatter Diffraction (EBSD) are all seamlessly integrated into this single universal platform. INCA means power and productivity. The system has been designed and built using over 35 years of microanalysis experience together with valuable input from the people who use this equipment for real applications -our customers.