ALD from Oxford Instruments
Atomic Layer Deposition from Oxford Instruments Plasma Technology
Atomic layer deposition (ALD) is a true "nano" technology, allowing ultra-thin films of a few nanometres to be deposited in a precisely controlled way. The two defining characteristics of ALD - self-limiting atomic layer-by-layer growth and highly conformal coating offer many benefits in semiconductor engineering, MEMS and other nanotechnology applications.
The benefits of ALD
- Because the ALD process deposits precisely one atomic layer in each cycle, complete control over the deposition process is obtained at the nanometre scale
- Conformal coating can be achieved even in high aspect ratio and complex structures
- Pin-hole and particle free deposition is achieved
A very wide variety of materials is possible with ALD:
- Oxides, including HfO2, HfSiO, Al2O3, Ta2O5, TiO2, La2O3, SiO2, ZnO
- Nitrides, including TiN, TaN, AlN, SiNx, HfN
- Metals, including Ru, Cu, W, Mo
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ALD Cycle
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Applications
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Remote Plasma
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System Features
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ALD can be used for many applications including:
- High-k gate oxides
- Storage capacitor dielectrics
- Pinhole-free passivation layers for OLEDs and polymers
- Passivation of crystal silicon solar cells
- High aspect ratio diffusion barriers for Cu interconnects
- Adhesion layers
- Organic semiconductors
- Highly conformal coatings for microfluidic and MEMS applications
- Other nanotechnology and nano-electronic applications
- Coating of nanoporous structures
- Fuel cells, e.g. single metal coating for catalyst layers
- Bio MEMS
The benefits of remote plasma Atomic Layer Deposition
In addition to the benefits of thermal ALD, remote plasma allows for a wider choice of precursor chemistry with enhanced film quality:
- Plasma enables low-temperature ALD processes and the remote source maintains low plasma damage
- Effective metal chemistry through use of hydrogen plasma rather than complex thermal precursors
- Eliminates the need for water as a precursor, reducing purge times between ALD cycles - especially for low temperatures.
- Higher quality films through improved removal of impurities, leading to lower resistivity, higher density, etc.
- Ability to control stoichiometry
- Plasma surface treatment
- Plasma cleaning of chamber is possible for some materials
ALD Tools from Oxford Instruments
| Substrates |
Up to 200mm wafers & pieces directly on stage |
Up to 200mm wafers handling and pieces on a carrier plate |
| Bubbled liquid & solid precursors |
Up to 3 |
Up to 4 |
| Max precursor source temperature |
200ºC (Jacket) |
200ºC (Oven & jacket) |
| Wafer delivery (inc source pot) |
Included |
Included |
Mfc controlled gas lines with rapid delivery system; 1) thermal gas precursors (e.g. NH3, O2) 2) plasma gases (e.g. O2, N2, H2)
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2 internally. Up to 8 in externally mounted gas pod |
Up to 10 in externally mounted gas pod
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| Plasma |
Option/field upgrade |
Option |
| Loading |
Open load |
Loadlock or cassette |
| Clusterable to other process modules |
No |
Yes - inc third party MESC modules as special option |
| Wafer stage temperature range |
25ºC – 400ºC |
25ºC – 400ºC (550ºC option) |
| Ellipsometry ports |
Yes |
Yes |
| Swagelok 10ms rapid pulsing ALD valves |
Yes |
Yes |