Atomic Layer Deposition (ALD)

Atomic Layer Deposition
ALD from Oxford Instruments

Atomic Layer Deposition from Oxford Instruments Plasma Technology

Atomic layer deposition (ALD) is a true "nano" technology, allowing ultra-thin films of a few nanometres to be deposited in a precisely controlled way. The two defining characteristics of ALD - self-limiting atomic layer-by-layer growth and highly conformal coating offer many benefits in semiconductor engineering, MEMS and other nanotechnology applications.

The benefits of ALD

  • Because the ALD process deposits precisely one atomic layer in each cycle, complete control over the deposition process is obtained at the nanometre scale
  • Conformal coating can be achieved even in high aspect ratio and complex structures
  • Pin-hole and particle free deposition is achieved

A very wide variety of materials is possible with ALD:

  • Oxides, including HfO2, HfSiO, Al2O3, Ta2O5, TiO2, La2O3, SiO2, ZnO
  • Nitrides, including TiN, TaN, AlN, SiNx, HfN
  • Metals, including Ru, Cu, W, Mo

 

  • ALD Cycle 
  • Applications 
  • Remote Plasma 
  • System Features 
  •  

ALD cycle for Al2O3 deposited using TMA and O2 plasma6. Only step 3 varies between H2O for the thermal process or O2 plasma:

 TMA    TMA Dose TMA Purge 
1.  TMA Dose 2. TMA Purge  3. O2 Plasma  4. Short post plasma purge

ALD can be used for many applications including:

  • High-k gate oxides
  • Storage capacitor dielectrics
  • Pinhole-free passivation layers for OLEDs and polymers
  • Passivation of crystal silicon solar cells
  • High aspect ratio diffusion barriers for Cu interconnects
  • Adhesion layers
  • Organic semiconductors
  • Highly conformal coatings for microfluidic and MEMS applications
  • Other nanotechnology and nano-electronic applications
  • Coating of nanoporous structures
  • Fuel cells, e.g. single metal coating for catalyst layers
  • Bio MEMS

The benefits of remote plasma Atomic Layer Deposition

In addition to the benefits of thermal ALD, remote plasma allows for a wider choice of precursor chemistry with enhanced film quality:

  • Plasma enables low-temperature ALD processes and the remote source maintains low plasma damage
  • Effective metal chemistry through use of hydrogen plasma rather than complex thermal precursors
  • Eliminates the need for water as a precursor, reducing purge times between ALD cycles - especially for low temperatures.
  • Higher quality films through improved removal of impurities, leading to lower resistivity, higher density, etc.
  • Ability to control stoichiometry
  • Plasma surface treatment
  • Plasma cleaning of chamber is possible for some materials

ALD Tools from Oxford Instruments  

 Feature  OpAL™  FlexAL®
Substrates Up to 200mm wafers & pieces directly on stage Up to 200mm wafers handling and pieces on a carrier plate
Bubbled liquid & solid precursors Up to 3 Up to 4
Max precursor source temperature 200ºC (Jacket) 200ºC (Oven & jacket)
Wafer delivery (inc source pot) Included Included
Mfc controlled gas lines with rapid delivery system;
1) thermal gas precursors (e.g. NH3, O2)
2) plasma gases (e.g. O2, N2, H2)

2 internally.
Up to 8 in externally
mounted gas pod
Up to 10 in externally mounted gas pod
Plasma Option/field upgrade Option
Loading Open load Loadlock or cassette
Clusterable to other process modules No Yes - inc third party MESC modules as special option
Wafer stage temperature range

25ºC – 400ºC

25ºC – 400ºC (550ºC option)

Ellipsometry ports Yes Yes
Swagelok 10ms rapid pulsing ALD valves Yes Yes

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